“Customized Optical Sensors in Standard CMOS Technology”, Presented by Werner Brockherde, Fraunhofer IMS

The co-integration of optical sensors with standard CMOS technology enables new smart optical sensor systems. The presentation displays how highly advanced detector technologies like pinned photodiodes, SPADs, or CCDs can be integrated into a standard CMOS process without detrimental intervention into the standard CMOS process flow. Continue reading ““Customized Optical Sensors in Standard CMOS Technology”, Presented by Werner Brockherde, Fraunhofer IMS”