Industrializing Test Solutions – Presented by Paul van Ulsen, Salland Engineering, at the 3rd edition of the Photonic Integration Conference, on September 26, 2017, at High Tech Campus Eindhoven, The Netherlands.
Testing and screening the modern chips like SerDes, 5G, Mems and now lately Photonics devices is getting more and more a challenge since normal available Automatic Tests Equipment (ATE) doesn’t always have the right capabilities to test these chips up to their performance. In the last 25 years Salland Engineering has dealt with this challenge over & over again and came every time with innovative new test solutions to concur this.
The abstract is about how Salland concurred some test challenges for massive parallel testing, RF> 30Ghz, SerDes> 30Gb and how this expertise could lead to joined future industrialized photonic chip test solutions. Continue reading “Industrializing Test Solutions – Presented by Paul van Ulsen, Salland Engineering”